XPort6170

The XPort6170 3U VPX removable module carrier has been designed from the ground up to meet today's ruggedized storage requirements. By utilizing X-ES solid-state NAND flash module technology, the XPort6170 provides a high-performance, high-density, reliable removable VPX memory solution. The XPort6170 is capable of operating within the demanding environments of MIL-STD-810F, including harsh temperatures from -40°C to 85°C as well as rigorous shock and vibration conditions.

Complementing the XPort6170 module carrier and designed with an extremely high-reliability connector, the XPort6190 SSD storage module will support up to 100,000 insertions and extractions. The use of SLC NAND flash components allows the XPort6190 to support least 100,000 program erase cycles. Depending on the application, the life expectancy can be increased with the utilization of the XPort6190's internal global wear leveling algorithms.

The combination of XPort6170 VPX carrier and XPort6190 SSD module provides the next generation of ruggedized removable media.

• Module carrier fits within a standard 3U VPX slot
• SATA backplane interface over P1
• -40°C to 85°C operating temperature range
• High-reliability 100,000 life cycle connector
• Easy insertion and extraction mechanism
• Designed for rugged environments
• Up to 64 GB of storage with the XPort6190 removable module

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VPX (VITA 46) P0 I/O

• I²C port

VPX (VITA 46) P1 I/O

• One SATA port

Physical Characteristics

• 3U VPX-REDI conduction- or air-cooled form factor
• Dimensions: 100 mm x 160 mm

XPort6190 SSD storage module

• Serial ATA (SATA) Rev 2.6 compliant
• 100 MB/s sustained read
• 70 MB/s sustained write
• 100,000 insertions and extractions
• 100,000 program and erase cycles
• Less than 2 W maximum power dissipation

Environmental Requirements

• Supported ruggedization levels (see the X-ES Ruggedization Chart): 1, 3, 5
• Conformal coating available as an ordering option